Tender Notice
Suppliers who are interested in bidding for the below MRDI tenders may email the following information to the responsible purchasing officer of the corresponding tender invitation to obtain further information:
- Company Name
- Email Address
- Telephone No.
Provision of Goods and Equipment
Supply and Install Metrology Tool for Thin Film/OCD Measurement, Stress Measurement and Ellipsometry Measurement
Supply and Install Metrology Tool for Front Metal and Back Metal Film Analysis, and Thermal Wave Measurement
Supply and Install Metrology Tool for Fourier Transform Infrared Spectroscopy (FTIR)
Supply and Install Metrology Tool for Overlay Measurement
Supply and Install Metrology Tool for Pattern Wafer Surface Defect Scanner
Supply and Install Metrology Tool for Non-pattern Wafer Surface Defect Scanner
Supply and Install Metrology Tool for Standalone Scanning Electron Microscope (SEM)
Supply and Install Metrology Tool for Tabletop Scanning Electron Microscope (SEM)
Supply and Install Metrology Tool for Total Reflection X-ray Fluorescence Spectroscopy (TXRF) for On-wafer Metallic Contamination Determination
Supply and Install Metrology Tool for Sheet Resistance Measurement
Supply and Install Metrology Tool for VPD-ICPMS for Metallic Contamination Determination
Supply and Install Metrology Tool for Atomic Force Microscopy (AFM)
Provision of Consultancies and Services
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